Capacitances in micro-strip detectors: a conformal mapping approach

The knowledge of capacitance in semiconductor micro-strip detectors is important for a correct design, simulation and understanding of the detectors. Analytical approaches can efficiently complement numerical methods providing quick results in the design phase. The conformal mapping method has proved to be the most effective analytical approach providing many realistic models [1]-[2]. In this paper improved analytical results are presented and compared with experimental data. The excellent agreement between predictions and measurements confirms the relevance of this approach to modeling realistic detectors.